From September 8 to 11, 2026, Bari, Italy, will host the 52nd AIC Meeting, the country’s leading conference dedicated to crystallography and X-ray diffraction (XRD). Organized by the Italian Crystallographic Association (AIC), the event is a key reference for the scientific community and for companies working in materials characterization and structural analysis.
The conference will bring together researchers, universities, laboratories, research centers and technology companies, creating an ideal environment to exchange knowledge and discuss the latest advances in crystallography, crystal structure analysis and diffraction techniques.
Over four days, participants will explore topics of major scientific and industrial interest. These include crystal structure determination, advanced materials, crystal growth and the latest applications of X-ray diffraction in both research and manufacturing. In addition, the meeting will strengthen the connection between fundamental research and technological innovation.
GNR Analytical Instruments Group will participate in the 52nd AIC Meeting as a sponsor and exhibitor. Visitors will have the opportunity to meet the GNR team at the company’s booth and attend a technical presentation, highlighting GNR’s ongoing commitment to developing advanced solutions for X-ray diffraction and materials characterization.
More information about the conference is available on the official AIC Meeting website.
What Is the 52nd AIC Meeting and Why Is It a Key Event for X-Ray Diffraction?
The 52nd AIC Meeting is the national conference organized by the Italian Crystallographic Association (AIC), the organization that promotes crystallographic research, education and scientific collaboration in Italy. For many years, AIC has supported the exchange of knowledge between universities, research centers and industry, contributing to the advancement of materials science and crystallography.
The conference is one of Italy’s leading scientific events for researchers and professionals working in X-ray diffraction (XRD), materials characterization and crystal structure analysis. In addition, it provides an important forum to discuss topics such as crystal growth, advanced materials and the latest analytical techniques used in both research laboratories and industrial applications.
Each edition attracts researchers, professors, students, laboratories, research centers and technology companies, creating an ideal environment for presenting scientific results, building new collaborations and encouraging technology transfer.
For this reason, the 52nd AIC Meeting is also an important opportunity for companies developing advanced analytical instrumentation for materials characterization and diffraction techniques.
Readers interested in these topics can also explore the GNR blog articles dedicated to X-ray diffraction (XRD), spectrometers and the main analytical techniques used in research laboratories and industry.
For additional information about the association and the conference, visitors are encouraged to consult the official website of the Italian Crystallographic Association (AIC).
The Conference Program: Research, Innovation and Industrial Applications
The 52nd AIC Meeting will feature a comprehensive scientific program designed to promote discussion between academia and industry. Over four days, participants will have the opportunity to explore the latest developments in crystallography and X-ray diffraction (XRD) through technical sessions and scientific presentations.
The conference will include scientific sessions, technical lectures and discussions focused on the most recent research achievements. In addition, the program will encourage active participation through a call for abstracts, giving researchers the opportunity to present their work and exchange ideas with experts from different scientific fields.
Special attention will also be devoted to early-career researchers. The meeting includes initiatives that support young scientists, together with AIC-funded scholarships aimed at encouraging the next generation of crystallographers and materials researchers.
Alongside fundamental research, the conference will highlight the growing role of industrial applications of crystallographic techniques. Universities, research institutes and technology companies will share case studies, innovative solutions and practical experiences in materials characterization and structural analysis.
For this reason, the 52nd AIC Meeting represents an excellent opportunity not only for the academic community but also for professionals working in industrial laboratories and companies developing advanced analytical technologies for materials science.
GNR at the 52nd AIC Meeting 2026: Exhibitor, Technical Presentation and Advanced XRD Solutions
GNR Analytical Instruments Group will participate in the 52nd AIC Meeting 2026 as an official sponsor and exhibitor, reaffirming its commitment to advancing materials characterization and X-ray diffraction technologies.
Throughout the conference, the GNR team will welcome visitors at the company’s dedicated booth. Researchers, scientists and industry professionals will have the opportunity to explore GNR’s latest analytical solutions and discuss current challenges in materials analysis with our technical specialists.
GNR has built a strong reputation in the field of materials characterization, developing analytical instruments for both laboratory and industrial applications. Its portfolio includes solutions for X-ray diffraction (XRD), Optical Emission Spectrometry (OES) and X-ray Fluorescence (XRF), supporting quality control, research and advanced materials development across multiple industries.
In addition, the conference will provide an ideal platform to showcase GNR’s latest XRD technologies for crystal phase identification, structural characterization and residual stress analysis. Visitors will be able to discover how these solutions support both scientific research and industrial quality control.
The following sections introduce GNR’s key X-ray diffraction systems, together with the company’s technical presentation at the conference, demonstrating how advanced diffraction technologies continue to bridge scientific research and real-world industrial applications.
Alessandro Torboli’s Presentation on GNR X-Ray Diffraction Solutions
Among the highlights of the 52nd AIC Meeting 2026, Alessandro Torboli, Sales Manager at GNR Analytical Instruments Group, will deliver a technical presentation focused on the company’s latest X-ray diffraction (XRD) solutions for materials characterization.
The presentation will place particular emphasis on powder X-ray diffraction (PXRD), one of the most widely used techniques for identifying crystalline phases, investigating crystal structures and supporting both research activities and industrial quality control.
In addition, Alessandro Torboli will illustrate how GNR XRD systems are applied in universities, research institutes and industrial laboratories, demonstrating their contribution to advanced materials research and process optimization across multiple sectors.
GNR’s participation in the scientific program reflects the company’s long-standing commitment to collaborating with the international scientific community and to developing innovative technologies that bridge academic research and industrial applications.
GNR Solutions for X-Ray Diffraction
GNR offers a comprehensive portfolio of X-ray diffraction (XRD) systems designed to address different analytical needs. While some instruments are specifically developed for powder X-ray diffraction (PXRD), others extend the capabilities of XRD to advanced applications such as residual stress analysis and retained austenite measurement. As a result, X-ray diffraction has become an essential tool not only for scientific research but also for industrial quality control and materials engineering.
Explorer is GNR’s XRD diffractometer specifically designed for powder diffraction and materials characterization. The system enables the identification and analysis of crystalline phases, supporting research, product development and quality control across a wide range of applications.
Its high analytical performance makes Explorer an ideal solution for universities, research institutes and industrial laboratories working with metals, ceramics, minerals and other advanced materials.
APD 2000 PRO is an X-ray diffractometer developed for phase identification and structural analysis of powdered samples. The instrument can be configured to meet different experimental requirements, making it suitable for both scientific research and routine industrial analysis.
Its versatility allows laboratories to perform accurate crystallographic investigations while ensuring reliable and reproducible analytical results across multiple application fields.
Stress-X extends the capabilities of X-ray diffraction beyond powder analysis. The system is specifically designed for non-destructive residual stress measurements on metallic components, providing accurate results without altering or damaging the sample.
Its automated robotic configuration makes Stress-X particularly suitable for advanced industrial applications where product quality, reliability and structural integrity are critical.
EDGE is GNR’s portable X-ray diffraction (XRD) system for the non-destructive measurement of residual stresses and retained austenite directly on components. The instrument can be used both in the laboratory and in the field, providing maximum operational flexibility.
EDGE is widely employed in the metallurgical, automotive and aerospace industries, as well as in maintenance and inspection activities. It demonstrates how modern X-ray diffraction technologies go far beyond phase identification, supporting engineers and researchers in evaluating the structural condition of components and making informed decisions throughout the product lifecycle.
FAQ
The 52nd AIC Meeting is the national conference organized by the Italian Crystallographic Association (AIC). It is one of Italy’s leading scientific events dedicated to crystallography, X-ray diffraction (XRD) and materials characterization, bringing together researchers, universities, research centers and technology companies.
The 52nd AIC Meeting will be held from September 8 to 11, 2026, in Bari, Italy. During the four-day conference, participants will attend scientific sessions, technical presentations, networking activities and an exhibition featuring leading technology providers.
The 2026 edition will take place in Bari, Italy, welcoming researchers and professionals from universities, laboratories, research institutes and companies active in crystallography, materials science and X-ray diffraction technologies.
The conference is organized by the Italian Crystallographic Association (AIC), a scientific organization dedicated to promoting research, education and collaboration in crystallography and materials science.
The scientific program will focus on X-ray diffraction (XRD), materials characterization, crystal structure analysis, crystal growth, advanced materials and the latest research and industrial applications of crystallographic techniques.